Implicit Test Pattern Generation Constrained to

This paper presents an implicit methodology that constrains a test pattern generator to identify test sequences which can be reproduced by cellular automata (CA). The so identiied CA can be synthesized as an autonomous-nite state machine and can be attached to the inputs of a circuit under test (e.g., a controller). In this way, the circuit under test preserves its integrity and its performance is not aaected by the proposed testing technique. The overall device (controller+CA) is an oo-line self-testable circuit which can potentially self-test all stuck-at faults both of the controller and the CA. Thus, the method can be viewed as a BIST strategy based on the embedding of deterministic test sequences.